Modeling of the low-frequency noise in thermal lens spectrometry

Israel Journal of Chemistry

Volumn 38, Issue 3, 1998, Pages 169-174

  Martín Biosca, Yolanda ^a   Rozé, Claude ^b   Ramis Ramos, Guillermo ^a  

^a UNIVERSITY OF VALENCIA   (Spain)

^b UNIVERSITÉ ET INSA DE ROUEN   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 22444452987     PISSN: 00212148     EISSN: None     Source Type: Journal    
DOI: 10.1002/ijch.199800018     Document Type: Article

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