The Position-Sensitive Atom Probe - A New Dimension In Atom Probe Analysis

Microscopy and Microanalysis

Volumn 4, Issue , 1998, Pages 76-77

  Cerezo, A ^a   Warren, P J ^a   Smith, G D W ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 22444452986     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S143192760002050X     Document Type: Article

References (5)

1. A. Cerezo et al., Rev. Sci. lustrum. 59 (1988) 862.
2. D. Blavette et al., Rev. Sci. lustrum. 64 (1993) 2911.
3. A.Cerezo et al., Appl. Surf. Sci. 76/77 (1994) 374.
4. A. Cerezo et al., Rev. Sci. lustrum. 69 (1998) 49.
5. P.P. Camus et al., Appl. Surf. Sci. 87/88 (1995) 305.