The Tomographic Atom Probe: A New Dimension In Material Analysis

Microscopy and Microanalysis

Volumn 4, Issue , 1998, Pages 78-79

  Deconihout, B ^a   Pareige, P ^a   Blavette, D ^a   Bostel, A ^a   Menand, A ^a  

^a UNIVERSITÉ ET INSA DE ROUEN   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 22444452748     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927600020511     Document Type: Article

References (8)

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2. M. K. Miller Surf. Sci 246 (1992) 428.
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4. A. Cerezo, T. J. Godfrey, J. M. Hyde, S. J. Sijbrandij and G. D. W. Smith, Applied Surface Science 76/77(1994)374-381
5. B. Deconihout, L. Renaud, G. Da Costa, M. Bouet, A. Bostel and D. Blavette, accepted in Ultramicroscopy
6. A. Cerezo, T. J. Godfrey, C. R. M. Grovener, M. G. Hetherington, R. M. Hoyle, J. A. Liddle, G. D. W. Smith and G. M. Worrall, J. Microsc 154 (1989) 215
7. B. Deconihout, A. Bostel, P. Bas, S. Chambreland, L. Letellier, F. Danoix and D. Blavette. Applied surface sciences 76/77 145-154 (1994)
8. T.F. Kelly, H-0 Andren, D. Blavette, P.P. Camus, A. Cerezo, A. Menand, M.K. Miller, G.D.W. Smith first wokshop on 3D atom probe analysis, Applied Surface Science 76/77 (1994)