The Effect of Focused Ion Beam (Fib) Specimen Geometry on X-Ray Fluorescence During Energy Dispersive X-Ray Spectroscopy (EDS) Analysis in the Transmission Electron Microscope (TEM)

Microscopy and Microanalysis

Volumn 4, Issue , 1998, Pages 856-857

  Longo, David M ^a   Howe, James M ^a   Johnson, William C ^a  

^a University of Virginia   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 22444452113     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927600024405     Document Type: Conference Paper

References (4)

1. F.A. Stevie, et al., Surface and Interface Analysis, 23 (1995) 61.
2. A.J. Leslie, et al., ISTFA Symposium (1995) 353.
3. R.J. Young, et al., Mat. Res. Symp. Proa, 199 (1990) 205.
4. This research was supported by the National Science Foundation under grant DMR-9496133