EFTEM and STEM EELS Spectrum Imaging

Microscopy and Microanalysis

Volumn 4, Issue , 1998, Pages 152-153

  Hunt, J A ^a   Harmon, R H ^a  

^a GATAN INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 22444451746     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927600020882     Document Type: Article

References (6)

1. Hunt, J.A. (1989), Proc. 47th Ann. Meet, of Electron Micros. Soc. Am., ed. G.W. Bailey, 398-399.
2. Jeanguillaume, C, and Colliex, C. (1989), Ultramicroscopy 28, 252-257.
3. Hunt, J.A., and Williams, D.B. (1991), Ultramicroscopy 38, 47-73
4. Botton, G, and L'Esperance, G. (1994), J. Microsc. 173, 9-25.
5. Lavergne, J.-L., Martin, J.-M., Belin, M. (1992), Microsc. Microanal. Microstruct. 3: 517-528.
6. Leapman, R.D. and Hunt, J.A. (1995), J. Micros. Soc. Am. 1, 93-108.