Parameter estimation for partially complete time and type of failure data

Biometrical Journal

Volumn 46, Issue 2, 2004, Pages 165-179

  Kundu, Debasis ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY KANPUR   (India)

Author keywords

Competing risks; Exponential distribution; Failure distribution; Incomplete data; Maximum likelihood estimators; Minimum variance unbiased estimator

Indexed keywords

MAXIMUM LIKELIHOOD ESTIMATION; PARAMETER ESTIMATION; RISK PERCEPTION;

COMPETING RISKS; EXPONENTIAL DISTRIBUTIONS; FAILURE DATA; FAILURE DISTRIBUTIONS; FAILURE TIME; HAZARD FUNCTION; INCOMPLETE DATA; LATENT FAILURES; MAXIMUM LIKELIHOOD ESTIMATOR; MINIMUM VARIANCE UNBIASED ESTIMATOR;

WEIBULL DISTRIBUTION;

EID: 22444435776     PISSN: 03233847     EISSN: None     Source Type: Journal    
DOI: 10.1002/bimj.200210014     Document Type: Article

References (9)

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