Electron Diffraction Using Transmission Electron Microscopy

Journal of Research of the National Institute of Standards and Technology

Volumn 106, Issue 6, 2001, Pages 997-1012

  Bendersky, Leonid A ^a,b   Gayle, Frank W ^a,c  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^c Metallurgy Division   (United States)

Author keywords

Crystal structure; Crystallography; Defects; Electron diffraction; Phase transitions; Quasicrystals; Transmission electron microscopy

Indexed keywords

EID: 2242455975     PISSN: 1044677X     EISSN: None     Source Type: Journal    
DOI: 10.6028/jres.106.051     Document Type: Article

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