JCPDS-ICDD Research Associateship (Cooperative Program with NBS/NIST)

Journal of Research of the National Institute of Standards and Technology

Volumn 106, Issue 6, 2001, Pages 1013-1028

  Wong Ng, W ^a,c   McMurdie, H F ^a,d   Hubbard, C R ^a,b   Mighell, A D ^a,d  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

^c NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^d Ceramics Division   (United States)

Author keywords

CD ROM data storage; Powder data evaluation; Research Associateship; SRMs for powder diffraction; Standard powder x ray diffraction patterns

Indexed keywords

EID: 2242452411     PISSN: 1044677X     EISSN: None     Source Type: Journal    
DOI: 10.6028/jres.106.052     Document Type: Article

References (38)

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