Resolving multiple particles in a highly segmented silicon array

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 547, Issue 2-3, 2005, Pages 464-479

  Paduszynski, T ^a   Sprunger, P ^a   De Souza, R T ^a   Hudan, S ^a   Alexander, A ^b   Davin, B ^a   Fleener, G ^b   McIntosh, A ^a   Metelko, C ^a   Moore, R ^b   Peters, N ^a   Poehlman, J ^b   Gauthier, J ^c   Grenier, F ^c   Roy, R ^c   Theriault D ^c   Bell, E ^d   Garey, J ^d   Iglio, J ^d   Keksis, A L ^d   Parketon, S ^d   Richers, C ^d   Shetty, D V ^d   Soisson, S N ^d   Soulioutis, G A ^d   Stein, B ^d   Yennello, S J ^d   more..

^a INDIANA UNIVERSITY   (United States)

^b INDIANA UNIVERSITY   (United States)

^c UNIVERSITÉ LAVAL   (Canada)

^d TEXAS A AND M UNIVERSITY   (United States)

Author keywords

Charge splitting in semiconductor detectors; Charged particle detection; Multi particle detection; Projectile fragmentation; Segmented silicon detector

Indexed keywords

ELECTRIC POTENTIAL; ELEMENTARY PARTICLES; ION BOMBARDMENT; PARTICLE DETECTORS; PASSIVATION; SEMICONDUCTOR MATERIALS; SENSORS;

CHARGE PARTICLE DETECTION; CHARGE-SPLITTING IN SEMICONDUCTOR DETECTORS; MULTI-PARTICLE DETECTION; PROJECTILE FRAGMENTATION; SEGMENTED SILICON DETECTOR;

SILICON;

EID: 22344451966     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2005.04.011     Document Type: Article

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