Growth and characterization of β-HgS thin films by annealing Hg2+-dithiol self-assembled multilayers

Journal of Dispersion Science and Technology

Volumn 26, Issue 5, 2005, Pages 641-644

  Mu, Jin ^a   Zhang, Yunyan ^a   Wang, Yanping ^b  

^a EAST CHINA UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

^b Shanghai Environmental Monitoring Center   (China)

Author keywords

Annealing; Dithiol; HgS; Self assembly; Thin film

Indexed keywords

FILM GROWTH; GRAIN SIZE AND SHAPE; IONS; MERCURY (METAL); SIMULATED ANNEALING; ULTRAVIOLET RADIATION; X RAY DIFFRACTION ANALYSIS;

HGS THIN FILMS; MERCURY ION; SCHERRER FORMULA; SHEET RESISTANCE;

THIN FILMS;

ANNEALING;

EID: 22244490693     PISSN: 01932691     EISSN: None     Source Type: Journal    
DOI: 10.1081/DIS-200057692     Document Type: Article

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