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Volumn 22, Issue 4-6, 1998, Pages 527-529

Product characterization by X-ray powder diffraction

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; CRYSTAL IMPURITIES; CRYSTAL SYMMETRY; DIFFRACTOMETERS; GRAIN SIZE AND SHAPE; STACKING FAULTS; STRAIN; STRESSES;

EID: 22244443845     PISSN: 13871811     EISSN: None     Source Type: Journal    
DOI: 10.1016/s1387-1811(98)80016-4     Document Type: Article
Times cited : (5)

References (4)
  • 1
  • 3
    • 0000864743 scopus 로고    scopus 로고
    • Collection of simulated XRD powder patterns for zeolites
    • M.M.J. Treacy, J.B. Higgins, R. von Ballmoos, Collection of simulated XRD powder patterns for zeolites, Zeolites 16 (1996).
    • (1996) Zeolites , vol.16
    • Treacy, M.M.J.1    Higgins, J.B.2    Von Ballmoos, R.3
  • 4
    • 22244461122 scopus 로고
    • International Centre for Diffraction Data, 12 Campus Blvd, Newtown Square, PA 19073-3273, USA
    • PDF Database (Sets 1-44) 1994, International Centre for Diffraction Data, 12 Campus Blvd, Newtown Square, PA 19073-3273, USA.
    • (1994) PDF Database (Sets 1-44)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.