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Volumn 22, Issue 4-6, 1998, Pages 527-529
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Product characterization by X-ray powder diffraction
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS MATERIALS;
CRYSTAL IMPURITIES;
CRYSTAL SYMMETRY;
DIFFRACTOMETERS;
GRAIN SIZE AND SHAPE;
STACKING FAULTS;
STRAIN;
STRESSES;
POWDER DIFFRACTION PATTERNS;
X RAY POWDER DIFFRACTION;
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EID: 22244443845
PISSN: 13871811
EISSN: None
Source Type: Journal
DOI: 10.1016/s1387-1811(98)80016-4 Document Type: Article |
Times cited : (5)
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References (4)
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