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Volumn 76-77, Issue , 2001, Pages 227-230

From piranha to barracuda: Mechanism of ozone and water vapor photoresist strip in a wet bench

Author keywords

Organic removal; Ozone; Stripping; Vapor

Indexed keywords

BARK STRIPPING; OZONE; PHOTORESISTS; REACTION KINETICS; VAPORS;

EID: 22244443291     PISSN: 10120394     EISSN: 16629779     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/SSP.76-77.227     Document Type: Conference Paper
Times cited : (4)

References (4)
  • 2
    • 0032312746 scopus 로고    scopus 로고
    • A Novel Resist and Post etch Residue Removal Process Using Ozonated Chemistry
    • Degendt, S., Wauters, J. and Heyns M.. “A Novel Resist and Post etch Residue Removal Process Using Ozonated Chemistry”, Solid State Technology. 41, 57-60(1998).
    • (1998) Solid State Technology , vol.41 , pp. 57-60
    • Degendt, S.1    Wauters, J.2    Heyns, M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.