Depth-resolved whole-field displacement measurement by wavelength-scanning electronic speckle pattern interferometry

Applied Optics

Volumn 44, Issue 19, 2005, Pages 3945-3953

  Ruiz, Pablo D ^a   Huntley, Jonathan M ^a   Wildman, Ricky D ^a  

^a LOUGHBOROUGH UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTERIZED TOMOGRAPHY; DIFFUSION; FOURIER TRANSFORMS; FUNCTIONS; KNOWLEDGE ACQUISITION; LIGHT SCATTERING; MIRRORS; PHASE SHIFT; SPECKLE;

SCANNING DEVICES; SCATTERING POTENTIAL; SPECKLE PATTERN INTERFEROMETRY; WAVELENGTH SCANNING INTERFEROMETRY (WSI);

INTERFEROMETRY;

EID: 22144490210     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.44.003945     Document Type: Article

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