Extended investigation of porosity in quasicrystals by synchrotron X-ray phase contrast radiography - I: In icosahedral AlPdMn grains

Journal of Crystal Growth

Volumn 281, Issue 2-4, 2005, Pages 623-638

  Agliozzo, S ^a,b   Brunello, E ^c   Klein, H ^d   Mancini, L ^e   Hartwig J ^a   Baruchel, J ^a   Gastaldi, J ^f  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b ISI FOUNDATION   (Italy)

^c UNIVERSITY OF FLORENCE   (Italy)

^d LABORATOIRE DE CRISTALLOGRAPHIE   (France)

^e SYRMEP Group   (Italy)

^f Cent de Recherche sur les Mecanismes   (France)

Author keywords

A1. Phase contrast radiography; A1. Porosity; B1. Icosahedral Al Pd Mn quasicrystal

Indexed keywords

ALUMINUM COMPOUNDS; ANNEALING; CRYSTAL GROWTH; DIFFUSION; GRAIN BOUNDARIES; POROSITY; RADIOGRAPHY; SOLIDIFICATION; SYNCHROTRONS; X RAY CRYSTALLOGRAPHY; X RAY RADIOGRAPHY;

ICOSAHEDRAL AL-PD-MN QUASICRYSTALS; PHASE CONTRAST RADIOGRAPHY; SYNCHROTRON X RAY RADIOGRAPHY; THERMAL VACANCY CONDENSATION;

QUASICRYSTALS;

EID: 22144484519     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2005.04.013     Document Type: Article

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