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Volumn 20, Issue 1, 2005, Pages 18-29

High-temperature dielectric properties of goethite from 400 to 3000 MHz

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; DIELECTRIC PROPERTIES; HIGH TEMPERATURE PROPERTIES; HYDROXYLATION; PERMITTIVITY; RELAXATION PROCESSES; THERMOGRAVIMETRIC ANALYSIS;

EID: 22144463549     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2005.0012     Document Type: Article
Times cited : (29)

References (35)
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