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EPJ Applied Physics

Volumn 30, Issue 3, 2005, Pages 153-158

Effect of annealing on properties of CuInS2 thin films

(4) Brini, R a Kanzari, M a Rezig, B a Werckmann, J b

a UNIVERSITY OF TUNIS EL MANAR (Tunisia)

b INSTITUT DE PHYSIQUE ET CHIMIE DES MATÉRIAUX DE STRASBOURG (France)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER COMPOUNDS; DEPOSITION; ENERGY DISPERSIVE SPECTROSCOPY; LIGHT ABSORPTION; LIGHT REFLECTION; LIGHT TRANSMISSION; MORPHOLOGY; PERMITTIVITY; REFRACTIVE INDEX; SURFACES; THIN FILMS; VACUUM;

ABSORPTION, REFLECTION AND TRANSMISSION COEFFICIENTS; COMPLEX DIELECTRIC CONSTANT; EMISSIVITY; OPTICAL CONSTANTS; THIN FILM STRUCTURE AND MORPHOLOGY;

ANNEALING;

EID: 22144446051 PISSN: 12860042 EISSN: None Source Type: Journal
DOI: 10.1051/epjap:2005031 Document Type: Article

Times cited : (9)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.