Reversible and persistent electrical bistability in single crystals of a self-assembled π-conjugated tetraaryl system: A submicrometer scale electrical characterization

Journal of the American Chemical Society

Volumn 127, Issue 27, 2005, Pages 9848-9854

  Tal, Shay ^a   Blumer Ganon, Batya ^a   Kapon, Moshe ^a   Eichen, Yoav ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRANSFER; CRYSTALLINE MATERIALS; CRYSTALS; ELECTRIC CONDUCTIVITY; ELECTRIC PROPERTIES; SELF ASSEMBLY; SUPRAMOLECULAR CHEMISTRY;

ELECTRICAL BISTABILITY; LOW (OFF) CONDUCTIVITY; THERMAL POPULATIONS;

SINGLE CRYSTALS;

4,4' BIPYRIDINE; N,N' BIS (6 OXO 1,6 DIHYDROPYRIDAZIN 3 YL) 4,4' PYRIDINIUM; PYRIDAZINE DERIVATIVE; UNCLASSIFIED DRUG;

AQUEOUS SOLUTION; ARTICLE; CHEMICAL STRUCTURE; CRYSTAL STRUCTURE; CYCLIC POTENTIOMETRY; ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; ELECTRON; ELECTRON SPIN RESONANCE; PROTON NUCLEAR MAGNETIC RESONANCE; SEMICONDUCTOR; SUPRAMOLECULAR CHEMISTRY; SYNTHESIS; X RAY CRYSTALLOGRAPHY;

EID: 22144439015     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja051154n     Document Type: Article

References (35)

1. Friend, R. H.; Gymer, R. W.; Holmes, A. B.; Burroughes, J. H.; Marks, R. N.; Taliani, C.; Bradley, D. D. C.; Dos Santos, D. A.; Bredas, J. L.; Logdlund, M.; Salaneck, W. R. Nature 1999, 397, 121-128.
2. Wurthner, F. Angew. Chem., Int. Ed. 2001, 40, 1037-1039.
3. Haefeldt, A.; Graetzel, M. Acc. Chem. Res. 2000, 33, 269-277.
4. Woehrle, D.; Meissner, D. Adv. Mater. 1991, 3, 129-138.
5. Min, G. Synth. Met. 2003, 135-136, 141-143.
6. Rogers, I. A.; Bao, Z.; Meier, M.; Dodabalapur, A.; Schueller, O. J. A.; Whitesides, G. M. Synth. Met. 2000, 115, 5-11.
7. Tsutsui, T.; Fujita, K. Adv. Mater. 2002, 14, 949-952.
8. MacDiarmid, A. G. Angew. Chem., Int. Ed. 2001, 40, 2581-2590.
9. Aviram, A.; Ratner, M. A. Chem. Phys. Lett. 1974, 29, 277-283.
10. Mujica, V.; Kemp, M.; Roitberg, A.; Ratner, M. J. Chem. Phys. 1996, 104, 7296-7305.
11. Carroll, R. L.; Gorman, C. B. Angew. Chem., Int. Ed. 2002, 41, 4378-4400.
12. Ellenbogen, J. C.; Love, J. C. Proc. IEEE 2000, 88, 386-426.
13. Taylor, D. M.; Mills, C. A. J. Appl. Phys. 2001, 90, 306-309.
14. Smith, S.; Forrest, S. R. Appl. Phys. Lett. 2004, 84, 5019-5021.
15. Majumdar, H. S.; Bandyopadhyay, A.; Bolognesi, A.; Pal, A. J. J. Appl. Phys. 2002, 91, 2433-2437.
16. Bandyopadhyay, A.; Pal, A. J. Adv. Mater. 2003, 15, 1949-1952.
17. Moller, S.; Forrest, S. R.; Perlov, C.; Jackson, W.; Taussig, C. J. Appl. Phys. 2003, 94, 7811-7819.
18. Moller, S.; Perlov, C.; Jackson, W.; Taussig, C.; Forrest, S. R. Nature 2003, 426, 166-169.
19. Mushrush, M.; Facchetti, A.; Lefenfeld, M.; Katz, H. E.; Marks, T. J. J. Am. Chem. Soc. 2003, 125, 9414-9423.
20. (a) Liu, C.; Pan, H.; Fox, M. A.; Bard, A. J. Chem. Mater. 1997, 9, 1422-1429.
21. (b) Fox, M. A.; Grant, J. V.; Melamed, D.; Torimoto, T.; Liu, C.; Bard, A. J. Chem. Mater. 1998, 10, 1771-1776.
22. (c) Gregg, B. A.; Fox, M. A.; Bard, A. J. J. Phys. Chem. 1989, 93, 4221-4234.
23. (d) Liu, C.; Pan, H.; Tang, H.; Fox, M. A.; Bard, A. J. J. Phys. Chem. 1995, 99, 7632-7636.
24. (e) Liu, C.; Pan, H.; Fox, M. A.; Bard, A. J. Science 1993, 267, 897-899.
25. Bird, C. L.; Kuhn, A. T. Chem. Soc. Rev. 1981, 10, 49-82.
26. Nonius, KappaCCD Server Software; Nonius BV: Delft, The Netherlands, 1997.
27. Otwinowski, Z.; Minor, W. Methods Enzymol. 1997, 276, 307-326.
28. Mackay, S.; Gilmore, C. J.; Edwards, C.; Tremayne, M.; Stuart, N.; Shankland, K. "maXus", a computer program for the solution and refinement of crystal structures from diffraction data; University of Glasgow: Scotland. U.K., Nonius BV. Delft: The Netherlands, and MacScience Co. Ltd.: Yokohama, Japan, 1998.
29. Sheldrick, G. M. SHELXL97, program for the refinement of crystal structures; University of Göttingen: Göttingen, Germany, 1997.
30. ORTEP, TEXRAY Structure Analysis Package; Molecular Structure Corporation: The Woodlands, TX, 1999.
31. See Supporting Information.
32. Yoshikawa, H.; Nishikiori, S.-I.; Ishida, T. J. Phys. Chem. B 2003, 107, 9261-9267.
33. Kidowaki, M.; Tamaoki, N. Chem. Commun. 2003, 290-291.
34. Cooke, G.; Augier de Cremiers, H.; Duclairoir, F. M. A.; Gray, M.; Vaqueiro, P.; Powell, A. V.; Rosair, G.; Rotello, V. M. Tetrahedron Lett. 2001, 42, 5089-5091.
35. All values are given with respect to the ground (stage chuck).