Effect of strain on grain and grain-boundary critical currents of YBCO coated conductors

IEEE Transactions on Applied Superconductivity

Volumn 15, Issue 2 PART III, 2005, Pages 2790-2793

  Palau, A ^a   Puig, T ^a   Obradors, X ^a   Feenstra, R ^b   Freyhardt, H C ^c  

^a INSTITUT DE CIÈNCIA DE MATERIALS DE BARCELONA ICMAB CSIC   (Spain)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

^c Zentrum fur Funktion Wekstoffe   (Germany)

Author keywords

Coated conductor; Critical current; Deformation process; Strain tolerance

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CURRENT DENSITY; FILM GROWTH; PERCOLATION (COMPUTER STORAGE); SQUIDS; TENSILE STRENGTH;

COATED CONDUCTORS; CRITICAL CURRENT; DEFORMATION PROCESS; STRAIN TOLERANCE;

ELECTRIC CONDUCTORS;

EID: 22044453144     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2005.848214     Document Type: Conference Paper

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