Analysis methodologies and experimental benchmarks for eddy current testing

IEEE Transactions on Magnetics

Volumn 41, Issue 5, 2005, Pages 1380-1383

  Cardelli, E ^a   Faba, A ^a   Specogna, R ^b   Tamburrino, A ^c   Trevisan, F ^b   Ventre, S ^c  

^a UNIVERSITY OF PERUGIA   (Italy)

^b UNIVERSITY OF UDINE   (Italy)

^c DAEIMI   (Italy)

Author keywords

Discrete geometric approach; Eddy current testing (ECT); Integral formulation

Indexed keywords

CALCULATIONS; CURRENT DENSITY; ELECTROMAGNETISM; FOURIER TRANSFORMS; NONDESTRUCTIVE EXAMINATION; NUMERICAL METHODS; PROBLEM SOLVING; TESTING;

DISCRETE GEOMETRIC APPROACH; EDDY CURRENT TESTING (ECT); INTEGRAL FORMULATION; PARALLEL COMPUTER SYSTEMS;

EDDY CURRENTS;

EID: 22044453060     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2005.844357     Document Type: Article

References (13)

1. R. Albanese and G. Rubinacci, Proc. Inst. Elect. Eng., vol. 135, Sep. 1988, pp. 457-462.
2. F. Trevisan, IEEE Trans. Magn., vol. 40, no. 2, pp. 1314-1317, Mar. 2004.
3. E. Cardelli and A. Faba, Proc. XII Int. Symp. Theoretical Electrical Engineering (ISTET 2003), vol. 1, Warsaw, Poland, Jul. 6-9, 2003, p. 167.
4. R. Albanese and G. Rubinacci, Adv. Imag. El. Phys., vol. 102, pp. 1-86, 1998.
5. G. Rubinacci, A. Tamburrino, S. Ventre, and F. Villone, Int. J. Applied Electromagn. Mech., vol. 19, pp. 345-349, 2004.
6. _, E'NDE, Electromagnetic Non-Destructive Evaluation (VIII), T. Sollier et al., Eds. Amsterdam, The Netherlands: IOS Press, 2004, pp. 77-84.
7. R. Albanese, G. Rubinacci, A. Tamburrino, S. Ventre, and F. Villone, COMPEL, vol. 20, no. 2, pp. 317-331, 2001.
8. G. Rubinacci, A. Tamburrino, S. Ventre, and F. Villone, IEEE Trans. Magn., vol. 40, no. 2, pp. 1290-1293, Mar. 2004.
9. L. Greengard and V. Rokhlin, J. Comput. Phys., vol. 73, pp. 325-348, 1987.
10. E. Tonti, IEEE Trans. Magn., vol. 38, no. 2, pp. 333-336, Mar. 2002.
11. A. Bossavit and L. Kettunen, IEEE Trans. Magn., vol. 36, no. 4, Jul. 2000.
12. F. Trevisan and L. Kettunen, IEEE Trans. Magn., vol. 40, no. 2, pp. 361-365, Mar. 2004.
13. O. Biro and K. Preis, IEEE Trans. Magn., vol. 25, no. 4, pp. 3145-3159, Jul. 1989.