A study on the short-wavelength and high-numerical-aperture phase-change recording

Chinese Physics

Volumn 12, Issue 1, 2003, Pages 107-111

  Liu, Bo ^a   Rum, Hao ^a   Gan, Fu Xi ^a  

^a SHANGHAI INSTITUTE OF OPTICS AND FINE MECHANICS   (China)

Author keywords

High numerical aperture; Phase change; Short wavelength; Transmission electron microscopy

Indexed keywords

APPROXIMATION THEORY; PHASE CHANGING CIRCUITS; PULSE WIDTH MODULATION; SIGNAL TO NOISE RATIO; TRANSMISSION ELECTRON MICROSCOPY; WAVELENGTH DISPERSIVE SPECTROSCOPY;

HIGH NUMERICAL APERTURE; PHASE-CHANGE; RECORDING MARKS; SHORT-WAVELENGTH;

DATA RECORDING;

EID: 22044443397     PISSN: 10091963     EISSN: None     Source Type: Journal    
DOI: 10.1088/1009-1963/12/1/320     Document Type: Review

References (12)

1. Feinleib J et al 1971 Appl. Phys. Lett. 18 254
2. Ohta T et al 2000 Japan. J. Appl. Phys. 39 770
3. Van Woudenberg R 1998 Japan. J. Appl. Phys. 37 2159
4. Tieke B et al 2000 Japan. J. Appl. Phys. 39 762
5. Mansfield S M and Kino G S 1990 Appl. Phys. Lett. 57 2615
6. Prikryl I 1998 1998' Technical Digest Series, OSA 8 98
7. Mansfield S M et al 1993 Opt. Lett. 18 305
8. Yamamoto K et al 1997 Japan. J. Appl. Phys. 36 456
9. Gan F X 1999 J. Non-cryst. Solids 266-257 176
10. Liu B, Ruan H and Gan F X 2002 Chin. Phys. 11 293
11. Liu B, Ruan H and Gan F X 2002 Chin. J. Inorganic Mater. 17 637 (in Chinese)
12. Liu B, Ruan H and Gan F X 2002 Chin. J. Semicond. 23 479 (in Chinese)