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Volumn 15, Issue 2 PART III, 2005, Pages 3684-3687
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Critical current degradation in HTS wires due to cyclic mechanical strain
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Author keywords
Critical current degradation; Cyclic strains; Electric devices; HTS wires
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Indexed keywords
CRITICAL CURRENT DEGRADATION;
CYCLIC STRAINS;
ELECTRIC DEVICES;
HTS WIRES;
CRITICAL CURRENTS;
DEGRADATION;
ELECTRIC EQUIPMENT;
ELECTROMAGNETISM;
STRAIN;
SUPERCONDUCTING WIRE;
THERMAL EFFECTS;
SUPERCONDUCTIVITY;
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EID: 22044434442
PISSN: 10518223
EISSN: None
Source Type: Journal
DOI: 10.1109/TASC.2005.849392 Document Type: Conference Paper |
Times cited : (9)
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References (4)
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