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Volumn 46, Issue SUPPL. 4, 1996, Pages 2343-2344
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Mechanical strain, conductance fluctuations, and dynamics of single tunneling defects
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 22044431849
PISSN: 00114626
EISSN: 15729486
Source Type: Journal
DOI: 10.1007/BF02571163 Document Type: Article |
Times cited : (5)
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References (6)
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