Infrared response of charge-coupled devices

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5677, Issue , 2005, Pages 201-208

  Loch, Matthias ^a   Widenhorn, Ralf ^a   Bodegom, Erik ^a,b  

^a PORTLAND STATE UNIVERSITY   (United States)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Activation energy; CCD; Impurities; Infrared

Indexed keywords

CCD SENSORS; IMPURITY ATOMS; INFRARED RESPONSE; PHOTON ABSORPTION;

ACTIVATION ENERGY; ELECTRON ENERGY LEVELS; IMAGE SENSORS; IMPURITIES; INFRARED RADIATION; LIGHT ABSORPTION; PHOTONS; QUANTUM EFFICIENCY;

CHARGE COUPLED DEVICES;

EID: 21944441788     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.610650     Document Type: Conference Paper

References (8)

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