Perception-based line quality measurement

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5668, Issue , 2005, Pages 111-122

  Wu, Wencheng ^a   Dalal, Edul N ^a  

^a XEROX CORPORATION   (United States)

Author keywords

Line quality; Line width variation; Raggedness; Waviness

Indexed keywords

LINE QUALITY; LINE WIDTH VARIATION; RAGGEDNESS; WAVIESS;

APPROXIMATION THEORY; ERROR ANALYSIS; FREQUENCIES; NUMERICAL ANALYSIS; PARAMETER ESTIMATION; TRANSFER FUNCTIONS;

IMAGE QUALITY;

EID: 21944438213     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.585968     Document Type: Conference Paper

References (6)

1. J. R. Hamerly and R. M. Springer, "Raggedness of edges", Journal of Optical Society of America, vol. 71, no. 3, pp 285-288, March 1981.
2. ISO13660, "Measurement of image quality attributes for hardcopy output - Binary monochrome text and graphic images", 2001
3. J. R. Hamerly, "An analysis of edge raggedness and blur", Journal of Applied Photographic Engineering, vol. 7, no. 6, pp 148-151, December 1981.
4. P. G. Engeldrum, Psychometric Scaling: A Toolkit for Imaging System Development, Imcotek Press, 2000.
5. P. G. J. Barten, Contrast Sensitivity of the Human Eye and its Effects on Image Quality, SPIE Optical Engineering Press, 1999.
6. W. Wu and R. Rasmussen, "Color Calibration Techniques for Print Quality Measurements", Proc. IS&Ps PICS 2001 conference, Montreal, Canada, pp. 76-79.