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Volumn 24, Issue 2, 1998, Pages 86-89

Testing critical point universality along the λ-line

Author keywords

[No Author keywords available]

Indexed keywords

MICROGRAVITY; MICROGRAVITY PROCESSING; STATISTICAL MECHANICS; THERMAL VARIABLES MEASUREMENT;

EID: 21944434485     PISSN: 1063777X     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.593544     Document Type: Article
Times cited : (5)

References (28)
  • 16
  • 17
    • 0021694677 scopus 로고
    • U. Eckera, A. Schmid, W. Weber, and H. Wuehl (Eds.), North Holland
    • V. Dohm, in Proc. of the 17th Int. Conf. on Low Temp. Phys., U. Eckera, A. Schmid, W. Weber, and H. Wuehl (Eds.), North Holland (1984), p. 953.
    • (1984) Proc. of the 17th Int. Conf. on Low Temp. Phys. , pp. 953
    • Dohm, V.1
  • 27
    • 33749822800 scopus 로고
    • Thesis, Stanford University
    • M. J. Adriaans, Thesis, Stanford University (1994).
    • (1994)
    • Adriaans, M.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.