Experimental N V and Ne VIII low-temperature dielectronic recombination rate coefficients

Astronomy and Astrophysics

Volumn 437, Issue 3, 2005, Pages 1151-1157

  Bohm S ^a   Muller A ^a   Schippers, S ^a   Shi, W ^a   Fogle, M ^b,d   Glans, P ^b   Schuch, R ^b   Danared, H ^c  

^a JUSTUS LIEBIG UNIVERSITY   (Germany)

^b STOCKHOLM UNIVERSITY   (Sweden)

^c MANNE SIEGBAHN LABORATORY   (Sweden)

^d OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Atomic data; Atomic processes; Line: formation; Plasmas; Radiation mechanisms: general

Indexed keywords

ATOMIC DATA; ATOMIC PROCESSES; GENERAL; LINE: FORMATION; RADIATION MECHANISMS;

COMPUTATIONAL COMPLEXITY; DATA ACQUISITION; DATA REDUCTION; ELECTRIC EXCITATION; ELECTROMAGNETIC FIELD EFFECTS; LITHIUM; LOW TEMPERATURE EFFECTS; OPTICAL RESOLVING POWER; PLASMAS; POSITIVE IONS; RADIATION EFFECTS; SPECTRUM ANALYSIS; TEMPERATURE MEASUREMENT;

ASTROPHYSICS;

EID: 21844480628     PISSN: 00046361     EISSN: None     Source Type: Journal    
DOI: 10.1051/0004-6361:20042500     Document Type: Article

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