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Volumn 25, Issue 6, 2005, Pages 11-18
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Performance analysis of cluster tool with non-revisiting in semiconductor manufacturing
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Author keywords
Cluster tool; Modeling; Petri net; Process with non revisiting
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Indexed keywords
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EID: 21844466453
PISSN: 10006788
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (2)
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References (31)
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