Reliability of high power diode laser bars in industrial applications

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5711, Issue , 2005, Pages 66-72

  Wolff, D ^a   Bonati, G ^a   Hennig, P ^a   Voelckel, H ^a  

^a JENOPTIK Laserdiode GmbH   (Germany)

Author keywords

Cooling; Degradation; Diode lasers; Ease of use; High power; High reliability; Long time tests; Low costs

Indexed keywords

COOLING; COSTS; HIGH POWER LASERS; INDUSTRIAL APPLICATIONS; INVESTMENTS; LASER BEAMS; SEMICONDUCTOR MATERIALS; SHORT CIRCUIT CURRENTS; SOLDERING;

BEAM QUALITY; EASE OF USE; HIGH POWER; HIGH POWER DIODE LASERS (HDL); HIGH RELIABILITY; LONG TIME TESTS; LONG-TIME AGING TEST (LAT); LOW COSTS; SEMICONDUCTOR BARS;

SEMICONDUCTOR LASERS;

EID: 21844456608     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.582666     Document Type: Conference Paper

References (0)