Surface and interface structure of Nd1.2Ba1.8Cu 3Oy epitaxial films studied by grazing incidence X-ray diffraction

Thin Solid Films

Volumn 486, Issue 1-2, 2005, Pages 178-181

  Salluzzo, M ^a   Fragneto, A ^a   De Luca, G M ^a,b   Scotti Di Uccio, U ^a,c   Torrelles, X ^d  

^a UNIVERSITY OF NAPLES FEDERICO II   (Italy)

^b UNIVERSITY OF SALERNO   (Italy)

^c UNIVERSITY OF CASSINO AND SOUTHERN LAZIO   (Italy)

^d INSTITUT DE CIÈNCIA DE MATERIALS DE BARCELONA ICMAB CSIC   (Spain)

Author keywords

GXID; High critical temperature films; Surface structure

Indexed keywords

DATA ACQUISITION; EPITAXIAL GROWTH; LOW ENERGY ELECTRON DIFFRACTION; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SINGLE CRYSTALS; SURFACE STRUCTURE; X RAY DIFFRACTION;

CRITICAL CURRENT DENSITY; CRYSTAL SURFACES; GRAZING INCIDENCE X-RAY DIFFRACTION (GIXD); HIGH CRITICAL TEMPERATURE FILMS;

THIN FILMS;

EID: 21844439481     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.11.214     Document Type: Conference Paper

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