Development of a compact beam intensity monitor for micro X-ray absorption fine structure measurements

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 467-468, Issue PART II, 2001, Pages 901-904

  Hayakawa, Shinjiro ^a   Suzuki, Motohiro ^b   Oshima, Masaharu ^c   Hirokawa, Takeshi ^a  

^a HIROSHIMA UNIVERSITY   (Japan)

^b Institute of Physical and Chemical Research   (Japan)

^c UNIVERSITY OF TOKYO   (Japan)

Author keywords

Beam intensity; Conversion electron; Synchrotron radiation; X ray excited current; XAFS

Indexed keywords

EID: 21844436276     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(01)00515-0     Document Type: Article

References (7)

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2. S. Hayakawa, T. Hirokawa, Y. Gohshi, M. Suzuki, S. Goto, Proc. of XRM 99, AIP, 2000, p. 92 and other papers in this proceedings.
3. S. Hayakawa, K. Kobayashi, Y. Gohshi, Rev. Sci. Instrum. 71 (2000) 20.
4. S. Hayakawa, S. Goto, T. Shoji, E. Yamada, Y. Gohshi, J. Synchrotron Rad. 5 (1998) 1114.
5. M. Yabashi, H. Yamazaki, K. Tamasaku, S. Goto, K. Takeshita, T. Mochizuki, Y. Yoneda, Y. Furukawa, T. Ishikawa, Proc. SPIE 3773 (1999) 2;
6. H. Yamazaki, H. Kimura, I. Kagaya, C. Yamashita, T. Ishikawa, Proc. SPIE 3773 (1999) 21.
7. M. Suzuki, N. Kawamura, T. Ishikawa, J. Synchrotron Rad. 8 (2001) 357.