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Volumn 467-468, Issue PART II, 2001, Pages 1092-1096
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Portable high precision small/wide angle X-ray scattering diffractometer
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Author keywords
Data acquisition; Data analysis; Diffractometer; SAXS; Synchrotron radiation
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Indexed keywords
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EID: 21844434266
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(01)00565-4 Document Type: Article |
Times cited : (1)
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References (4)
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