Fault detection properties of global, local and time evolving models for batch process monitoring

Journal of Process Control

Volumn 15, Issue 7, 2005, Pages 799-805

  Ramaker, Henk Jan ^a   Van Sprang, Eric N M ^a   Westerhuis, Johan A ^a   Smilde, Age K ^a  

^a UNIVERSITY OF AMSTERDAM   (Netherlands)

Author keywords

MSPC; Overall type I error; Statistical batch process monitoring

Indexed keywords

BATCH DATA PROCESSING; COMPUTER SIMULATION; DATA REDUCTION; ERROR ANALYSIS; FAULT TOLERANT COMPUTER SYSTEMS; MATHEMATICAL MODELS; SIGNAL PROCESSING; STATISTICAL METHODS;

FAULT DETECTION PROPERTY; MSPC; OVERALL TYPE 1 ERROR; STATISTICAL BATCH PROCESS MONITORING;

PROCESS CONTROL;

EID: 21844434004     PISSN: 09591524     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jprocont.2005.02.001     Document Type: Article

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