Pitfalls and their remedies in time-resolved fluorescence spectroscopy and microscopy

Journal of Fluorescence

Volumn 15, Issue 3, 2005, Pages 377-413

  VandeVen, Martin ^a   Ameloot, Marcel ^a   Valeur, Bernard ^b   Boens, Noël ^c  

^a HASSELT UNIVERSITY   (Belgium)

^b Ecole Normale Superieure de Cachan   (France)

^c UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

Artifacts; Data Analysis; Electronics; FLIM; Optics; Phase modulation fluorometry; Pulse fluorometry; Sample preparation; Single photon timing; Time resolved fluorescence microscopy; Time resolved fluorescence spectroscopy

Indexed keywords

DATA REDUCTION; ERROR ANALYSIS; FREQUENCY DOMAIN ANALYSIS; GRAPH THEORY; MICROSCOPIC EXAMINATION; PARAMETER ESTIMATION; PHOTONS; SAMPLING; SPECTROSCOPIC ANALYSIS;

ARTIFACTS; FLIM; PHASE-MODULATION FLUOROMETRY; PULSE FLUOROMETRY; SAMPLE PREPARATIONS; SINGLE-PHOTON TIMING; TIME-RESOLVED FLUORESCENCE MICROSCOPY; TIME-RESOLVED FLUORESCENCE SPECTROSCOPY;

FLUORESCENCE;

EID: 21844433172     PISSN: 10530509     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10895-005-2632-1     Document Type: Article

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