Scanning tunneling microscopy of fullerenes on metal and semiconductor surfaces

Physics-Uspekhi

Volumn 40, Issue 3, 1997, Pages 275-290

  Bakhtizin, R Z ^a   Hashizume, T ^b   Wang, X D ^c   Sakurai, T ^c  

^a Birsk Branch of Federal State Budgetary Educational Establishment of Higher Education Bashkir State University   (Russian Federation)

^b HITACHI LTD   (Japan)

^c TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 21744461101     PISSN: 10637869     EISSN: None     Source Type: Journal    
DOI: 10.1070/PU1997v040n03ABEH000213     Document Type: Article

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