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Volumn 343, Issue 1-3, 2005, Pages 79-84
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Determination of damping force between atomic force microscope tips and sample using an inverse methodology
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Author keywords
Atomic force microscope; Conjugate gradient method; Damping force; Interaction force; Inverse vibration problem
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CONJUGATE GRADIENT METHOD;
DAMPING;
DISPLACEMENT MEASUREMENT;
MICROSCOPES;
NUMERICAL METHODS;
VIBRATION ANALYSIS;
AFM CANTILEVERS;
DAMPING FORCES;
INTERACTION FORCES;
INVERSE CALCULATION;
INVERSE METHODOLOGY;
INVERSE SOLUTION;
INVERSE VIBRATION PROBLEM;
NUMERICAL RESULTS;
INVERSE PROBLEMS;
ACCURACY;
ANALYTICAL ERROR;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
CALCULATION;
CONJUGATE;
FORCE;
MATHEMATICAL COMPUTING;
MEASUREMENT;
METHODOLOGY;
MICROCOMPUTER;
MICROSCOPE;
SAMPLE;
TECHNIQUE;
TIME;
VIBRATION;
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EID: 21744450422
PISSN: 03759601
EISSN: None
Source Type: Journal
DOI: 10.1016/j.physleta.2005.06.005 Document Type: Article |
Times cited : (2)
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References (19)
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