메뉴 건너뛰기




Volumn 343, Issue 1-3, 2005, Pages 79-84

Determination of damping force between atomic force microscope tips and sample using an inverse methodology

Author keywords

Atomic force microscope; Conjugate gradient method; Damping force; Interaction force; Inverse vibration problem

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONJUGATE GRADIENT METHOD; DAMPING; DISPLACEMENT MEASUREMENT; MICROSCOPES; NUMERICAL METHODS; VIBRATION ANALYSIS;

EID: 21744450422     PISSN: 03759601     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physleta.2005.06.005     Document Type: Article
Times cited : (2)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.