Light scattering of ultrafine silica particles by VUV synchrotron radiation

Nano Letters

Volumn 5, Issue 6, 2005, Pages 1009-1015

  Shu, Jinian ^b   Wilson, Kevin R ^b   Arrowsmith, Alan N ^a,c   Ahmed, Musahid ^b   Leone, Stephen R ^a,b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF COLORADO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADVANCED LIGHT SOURCE (ALS); AMORPHOUS SILICA; PHOTON DETECTORS; VACUUM ULTRAVIOLET (VUV) LIGHT SCATTERING;

LIGHT POLARIZATION; LIGHTING; PARTICLE SIZE ANALYSIS; PHOTODETECTORS; PHOTONS; SILICA; SYNCHROTRON RADIATION; ULTRAVIOLET RADIATION; VACUUM APPLICATIONS;

LIGHT SCATTERING;

SILICON;

ARTICLE; CHEMICAL MODEL; CHEMISTRY; LIGHT; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; PHOTON; RADIATION SCATTERING; SCANNING ELECTRON MICROSCOPY; SENSITIVITY AND SPECIFICITY; SYNCHROTRON; ULTRAVIOLET RADIATION; VACUUM;

LIGHT; MICROSCOPY, ELECTRON, SCANNING; MODELS, CHEMICAL; NANOTECHNOLOGY; PARTICLE SIZE; PHOTONS; SCATTERING, RADIATION; SENSITIVITY AND SPECIFICITY; SILICON; SYNCHROTRONS; ULTRAVIOLET RAYS; VACUUM;

EID: 21644478201     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl050315i     Document Type: Article

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