A study of parametric yield estimation by uniform design sampling

International Conference on Solid-State and Integrated Circuits Technology Proceedings, ICSICT

Volumn 2, Issue , 2004, Pages 1068-1071

  Jing, Ming E ^a   Wang, Jun Ping ^a   Chen, Ke Dong ^b   Hao, Yue ^a  

^a XIDIAN UNIVERSITY   (China)

^b QINGDAO UNIVERSITY   (China)

Author keywords

Acceptability region; Monte Carlo method; Uniform design sampling; Yield estimation

Indexed keywords

COMPUTER AIDED DESIGN; INTEGRATION; MONTE CARLO METHODS; NUMERICAL ANALYSIS; PROBABILITY DENSITY FUNCTION; SAMPLING; SURFACE PHENOMENA; VLSI CIRCUITS;

ACCEPTIBILITY REGION; CIRCUIT SIMULATION; UNIFORM DESIGN SAMPLING; YIELD ESTIMATION;

INTEGRATED CIRCUIT LAYOUT;

EID: 21644462826     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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