In situ diffraction profile analysis during tensile deformation motivated by molecular dynamics

Materials Science and Engineering: A

Volumn 400-401, Issue 1-2 SUPPL., 2005, Pages 329-333

  Van Swygenhoven, Helena ^a   Budrovic Z ^a   Derlet, P M ^a   Froseth A G ^a   Van Petegem, S ^a  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

Al; Grain boundary; Molecular dynamics simulations; Ni; X ray

Indexed keywords

ELASTIC MODULI; GRAIN BOUNDARIES; MOLECULAR DYNAMICS; NANOSTRUCTURED MATERIALS; STRUCTURAL ANALYSIS; X RAY DIFFRACTION;

ATOMISTIC SIMULATIONS; BRAGG DIFFRACTION PEAKS; NANOCRYSTALLINE METALS; TENSILE DEFORMATION;

DEFORMATION;

DEFORMATION;

EID: 21644455001     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2005.03.041     Document Type: Article

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