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Volumn , Issue , 2004, Pages 989-992
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Device technologies for high quality and smaller pixel in CCD and CMOS image sensors
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Author keywords
[No Author keywords available]
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Indexed keywords
CHARGE COUPLED DEVICES;
CMOS INTEGRATED CIRCUITS;
CROSSTALK;
ELECTRIC FIELDS;
IMAGE SENSORS;
IMPURITIES;
MICROLENSES;
PHOTODIODES;
DIGITAL CAMERAS;
PIXELS;
CELLULAR PHONES;
CMOS SENSORS;
CORRELATED DOUBLE SAMPLING (CDS);
TRANSFER GATE (TG);
IMAGING SYSTEMS;
MICROLENSES;
CCD IMAGE SENSORS;
CMOS IMAGE SENSOR;
DESIGN ARCHITECTURE;
DEVICE TECHNOLOGIES;
GAIN SATURATION;
HIGH QUALITY;
IMAGING DEVICE;
MEGAPIXELS;
ON CHIPS;
PROCESS ARCHITECTURE;
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EID: 21644452057
PISSN: 01631918
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (23)
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References (5)
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