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Volumn 19, Issue 6, 2005, Pages 14-

Bismuth in lead-free systems - Not to fear

(1)  Hwang, Jennie S a  

a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ASSEMBLY; COMPOSITION; CRACK PROPAGATION; ELECTRONIC EQUIPMENT; HEALTH RISKS; LEAD; LOW TEMPERATURE EFFECTS; SOLDERED JOINTS; STRESSES; THERMODYNAMICS; WETTING;

EID: 21644449967     PISSN: 15298930     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Short Survey
Times cited : (3)

References (1)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.