Using artificial neural networks to examine event-related potentials of face memory

Neural Network World

Volumn 15, Issue 3, 2005, Pages 215-227

  Graham, Reiko ^a   Dawson, Michael R W ^a  

^a DUKE UNIVERSITY   (United States)

Author keywords

Artificial neural networks; Event related potentials; Face recognition; Memory; Repetition effects

Indexed keywords

ATTENUATION; BRAIN; DATA ACQUISITION; ELECTROENCEPHALOGRAPHY; FACE RECOGNITION; PATHOLOGY; WAVEFORM ANALYSIS;

EPOCHS; EVENT-RELATED POTENTIAL (ERP); EVENT-RELATED POTENTIALS; REPETITION EFFECTS;

NEURAL NETWORKS;

EID: 21644447804     PISSN: 12100552     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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