Seal imprint verification with rotation invariance

IEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS

Volumn 1, Issue , 2004, Pages 597-600

  Matsuura, Takenobu ^a   Yamazaki, Kenta ^a  

^a TOKAI UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; BIT ERROR RATE; BROADCASTING; COMPUTER SIMULATION; MATHEMATICAL MODELS; SIGNAL TO NOISE RATIO; SPECTRUM ANALYSIS; WATERMARKING;

PERIODIC FUNCTIONS; ROTATION ANGLES; ROTATION INVARIANCE; SEAL IMPRINT VERIFICATION;

ROTATION;

EID: 21644432609     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

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