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Volumn 1, Issue , 2004, Pages 153-156

Finite element modeling of ultrasonic separation at the microscale

Author keywords

Acoustic separation; FEM; Flexural waves; Microfluidics; PZT

Indexed keywords

ACOUSTIC SEPARATION; MICROFLUIDICS; PHASE VELOCITY; PZT;

EID: 21544484795     PISSN: 10510117     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (5)

References (7)
  • 1
    • 4143107714 scopus 로고    scopus 로고
    • Low-voltage high-speed ultrasonic chromatography for microfluidic assays
    • Hilton Head Island. South Carolina
    • C.H. Lee, A. Lai, "Low-Voltage High-Speed Ultrasonic Chromatography For Microfluidic Assays", Proc. of the Solid State Sen. Act. Workshop. Hilton Head Island. South Carolina, pp. 206-209, 2002
    • (2002) Proc. of the Solid State Sen. Act. Workshop , pp. 206-209
    • Lee, C.H.1    Lai, A.2
  • 2
    • 4143053712 scopus 로고    scopus 로고
    • Ultrasonic separation in microfluidic capillaries
    • M.K. Araz, C.H. Lee, A. Lal, "Ultrasonic Separation In Microfluidic Capillaries" IEEE Symp. on Ultrasonics, Vol: 1 P:1066-1069, 2003
    • (2003) IEEE Symp. on Ultrasonics , vol.1 , pp. 1066-1069
    • Araz, M.K.1    Lee, C.H.2    Lal, A.3
  • 3
    • 0004285058 scopus 로고
    • Pergamon Press, Bristol, GB
    • M. Redwood. Mechanical Waveguides, p. 235-252, Pergamon Press, Bristol, GB, 1960
    • (1960) Mechanical Waveguides , pp. 235-252
    • Redwood, M.1
  • 4
    • 0000289237 scopus 로고
    • Acoustic radiaotion pressure on a compressible sphere
    • K. Yosioka and Y. Kawasima, "Acoustic radiaotion pressure on a compressible sphere," Acustica, vol. 5, pp. 167-173, 1955.
    • (1955) Acustica , vol.5 , pp. 167-173
    • Yosioka, K.1    Kawasima, Y.2
  • 7
    • 0033285639 scopus 로고    scopus 로고
    • Macroscopic modeling of fine line adhesion tests
    • Symposium M: Material Reliability in Microelectronics IX
    • A.A. Volinsky, J.C. Nelson, W.W. Gerberich, "Macroscopic Modeling Of Fine Line Adhesion Tests", Mater. Res. Soc. Proc. Vol. 563, 1999 Symposium M: Material Reliability in Microelectronics IX
    • (1999) Mater. Res. Soc. Proc. , vol.563
    • Volinsky, A.A.1    Nelson, J.C.2    Gerberich, W.W.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.