Determination of the lattice constant of epitaxial layers of III-V compounds

Journal of Crystal Growth

Volumn 44, Issue 5, 1978, Pages 513-517

  Hornstra, J ^a   Bartels, W J ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 21544484548     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-0248(78)90292-0     Document Type: Article

References (13)

1. Determination of the lattice constant of epitaxial layers of III-V compounds
2. Double-crystal spectrometer measurements of lattice parameters and X-ray topography on heterojunctions GaAs–AlxGa1−xAs