Band discontinuity for GaAs/AlGaAs heterojunction determined by C-V profiling technique

Journal of Applied Physics

Volumn 57, Issue 12, 1985, Pages 5340-5344

  Watanabe, Miyoko Oku ^a   Yoshida, Jiro ^a   Mashita, Masao ^a   Nakanisi, Takatosi ^a   Hojo, Akimichi ^a  

^a TOSHIBA CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 21544480708     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.334852     Document Type: Article

References (16)