Measurement of the intersubband scattering rate in semiconductor quantum wells by excited state differential absorption spectroscopy

Applied Physics Letters

Volumn 63, Issue 10, 1993, Pages 1354-1356

  Faist, Jerome ^a   Capasso, Federico ^a   Sirtori, Carlo ^a   Sivco, Deborah L ^a   Hutchinson, Albert L ^a   Chu, Sung Nee G ^a   Cho, Alfred Y ^a  

^a LUCENT TECHNOLOGIES   (United States)

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EID: 21544480133     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.109675     Document Type: Article

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