Low-frequency, high-temperature conductance and capacitance measurements on metal-oxide-silicon carbide capacitors

Journal of Applied Physics

Volumn 75, Issue 1, 1994, Pages 604-607

  Ouisse, T ^a   Becourt N ^b   Jaussaud, C ^b   Templier, F ^a  

^a CNRS   (France)

^b CEA LETI   (France)

Author keywords

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Indexed keywords

EID: 21544472704     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.355846     Document Type: Article

References (8)