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Volumn 66, Issue 6, 1995, Pages 3584-3592
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Thermal imaging by atomic force microscopy using thermocouple cantilever probes
a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 21544468949
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1145474 Document Type: Article |
Times cited : (143)
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References (31)
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