Determination of nonradiative surface layer thickness in quantum dots etched from single quantum well GaAs/AlGaAs

Applied Physics Letters

Volumn 55, Issue 14, 1989, Pages 1427-1429

  Clausen Jr , E M ^a   Craighead, H G ^a   Worlock, J M ^a   Harbison, J P ^a   Schiavone, L M ^a   Florez, L ^a   Van der Gaag, B ^a  

^a TELCORDIA TECHNOLOGIES   (United States)

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EID: 21544458268     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.101614     Document Type: Article

References (15)