Dielectric function spectra of strained and relaxed Si1-xGe x alloys (x=0-0.25)

Journal of Applied Physics

Volumn 75, Issue 9, 1994, Pages 4642-4647

  Pickering, C ^a   Carline, R T ^a  

^a DEFENCE SCIENCE AND TECHNOLOGY LABORATORY   (United Kingdom)

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EID: 21544456592     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.355914     Document Type: Article

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